Project Z02

Z02 High-resolution characterization of interfaces

Our project provides technical and analytical support for various CRC projects by application and further development of experimental and simulation transmission electron microscopy (TEM) as well as of advanced film growth techniques. Further development of nanoscale electric field mapping aims on studies of space charge layers in solids during in-situ and environmental TEM. A more quantitative analysis of high-resolution image contrasts and their temporal evolution during in-situ TEM experiments will be pursued. In addition, well-characterized oxide thin films with engineered interfaces will be grown by a metalorganic aerosol deposition technique for projects focusing on thin films and their interfaces.